http://www.irisa.fr/triskell/publis/2001/Baudry01b.pdf
What are the testability improvements when using design patterns?
Can the testability problems be localized (confined) to the diagram subset that corresponds to the
application of a design pattern?
Figure 4 - state machine implemented in a single class equivalent to a "functional" design
Figure 5 - state machine implemented with the State design pattern
논문은 figure 5의 경우 readability 그리고 state의 제어가 용이하기 때문에 figure 4보다 testability가 높다고
설명한다.
However, new testing problems arise that seem specifically linked to object-oriented design and especially
the micro-architecture corresponding to the design pattern based implementation.
3. Testing conflicts
3.2 Concurrent usage testing conflicts
3.3 Self usage conflict
3.4 Inheritance complexity
5. Conclusion
This paper discusses two configurations of an OO design that can weaken its testability. Since testing
problems are usually too complex to be fully controlled at the global level, we discussed particular design
patterns microarchitectures, widely used in the OO domain, as possible basic refinement operators. Using two
of them, the State and the Abstract Factory, we illustrated how testing risks might be avoided. The two risk
mitigation techniques we used are design information enhancement, and design refinement constraining.
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